Mighty Macros and Powerful Parameters: Maximizing Efficiency and Flexibility in HDL Programming Muneeb Ulla Shariff, Vineeth Kumar Veepuri, Nancy Dimri and Mahadevaswamy B N, Mirafra Technologies, India
An Efficient Segmented Random Access Scan Architecture with Test Compression Maddumage Karunaratne1 and Bejoy G. Oomman2, 1University of Pittsburgh, USA, 2Genesys Testware/Broadcom Inc., USA
